Name: Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Price: 3250.95 DKK
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Author: Siegfried Hofmann
ISBN: 9783642273803

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science af Siegfried Hofmann

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Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.

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Sprog:
Engelsk

ISBN:
9783642273803

Forlag:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Indbinding:
Hardback

Sideantal:
528

Udgivet:
25. oktober 2012

Udgave:
2013

Størrelse:
161x241x34 mm.

Vægt:
940 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 10. december 2024

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Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.

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