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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - Siegfried Hofmann - Bog

- A User-Oriented Guide

Bag om Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783642273803
  • Indbinding:
  • Hardback
  • Sideantal:
  • 528
  • Udgivet:
  • 25. Oktober 2012
  • Udgave:
  • 2013
  • Størrelse:
  • 161x241x34 mm.
  • Vægt:
  • 940 g.
  • 2-3 uger.
  • 19. Juli 2024
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Beskrivelse af Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.

Brugerbedømmelser af Auger- and X-Ray Photoelectron Spectroscopy in Materials Science



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