Bøger i Materials science library serien

This follow-up to the first volume presents an integrated survey of the most recent research, engineering development and commercial application of amorphous and microcrystalline semiconductor devices, with emphasis on materials properties and their relationship to performance.

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi