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CMOS RF Circuit Design for Reliability and Variability - Jiann-Shiun Yuan - Bog

af Jiann-Shiun Yuan

indgår i SpringerBriefs in Reliability serien

indgår i SpringerBriefs in Applied Sciences and Technology serien

CMOS RF Circuit Design for Reliability and Variability af Jiann-Shiun Yuan
Bag om CMOS RF Circuit Design for Reliability and Variability

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9789811008825
  • Indbinding:
  • Paperback
  • Sideantal:
  • 106
  • Udgivet:
  • 21. April 2016
  • Udgave:
  • 12016
  • Størrelse:
  • 155x235x6 mm.
  • Vægt:
  • 1825 g.
  • 8-11 hverdage.
  • 16. Oktober 2024
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Beskrivelse af CMOS RF Circuit Design for Reliability and Variability

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits.

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