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Defect and Microstructure Analysis by Diffraction - Bog

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Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780198501893
  • Indbinding:
  • Hardback
  • Sideantal:
  • 808
  • Udgivet:
  • 6. Januar 2000
  • Størrelse:
  • 164x238x49 mm.
  • Vægt:
  • 1292 g.
  • 2-3 uger.
  • 11. Oktober 2024
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Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af Defect and Microstructure Analysis by Diffraction

Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction.

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