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Digital Holography for MEMS and Microsystem Metrology - Anand (Nanyang Technological University Asundi - Bog

Bag om Digital Holography for MEMS and Microsystem Metrology

By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780470978696
  • Indbinding:
  • Hardback
  • Sideantal:
  • 232
  • Udgivet:
  • 28. juli 2011
  • Størrelse:
  • 164x237x19 mm.
  • Vægt:
  • 486 g.
  • Ukendt - mangler pt..

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Medlemspris

Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af Digital Holography for MEMS and Microsystem Metrology

By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection.

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