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Digital Noise Monitoring of Defect Origin - Telman Aliev - Bog

af Telman Aliev

indgår i Lecture Notes in Electrical Engineering serien

Digital Noise Monitoring of Defect Origin af Telman Aliev
Bag om Digital Noise Monitoring of Defect Origin

This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780387717531
  • Indbinding:
  • Hardback
  • Sideantal:
  • 224
  • Udgivet:
  • 25. juli 2007
  • Udgave:
  • 2007
  • Størrelse:
  • 155x235x14 mm.
  • Vægt:
  • 1120 g.
  • 8-11 hverdage.
  • 7. marts 2025
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This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise.

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