Name: Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Price: 443.95 DKK
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Author: Sarah Fearn
ISBN: 9781681740249

Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science af Sarah Fearn

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Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.

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Sprog:
Engelsk

ISBN:
9781681740249

Forlag:
Morgan & Claypool Publishers

Indbinding:
Paperback

Sideantal:
66

Udgivet:
16. oktober 2015

Størrelse:
256x177x8 mm.

Vægt:
192 g.

Leveringstid: 2-3 uger.
Forventet levering: 17. december 2024

Forlænget returret til d. 31. januar 2025

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Beskrivelse af Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.

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