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Microelectronic Reliability: Integrity Assessment and Assurance - Emiliano Pollino - Bog

af Emiliano Pollino

indgår i Materials science library serien

Microelectronic Reliability: Integrity Assessment and Assurance af Emiliano Pollino
Bag om Microelectronic Reliability: Integrity Assessment and Assurance

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780890063507
  • Indbinding:
  • Hardback
  • Sideantal:
  • 556
  • Udgivet:
  • 1. april 1989
  • Størrelse:
  • 161x41x235 mm.
  • Vægt:
  • 1089 g.
  • 2-3 uger.
  • 17. december 2024
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Forlænget returret til d. 31. januar 2025

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A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi

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