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Reliability Wearout Mechanisms in Advanced CMOS Technologies - Alvin W. (IBM) Strong - Bog

af Alvin W. (IBM) Strong

indgår i IEEE Press Series on Microelectronic Systems serien

Reliability Wearout Mechanisms in Advanced CMOS Technologies af Alvin W. (IBM) Strong
Bag om Reliability Wearout Mechanisms in Advanced CMOS Technologies

This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780471731726
  • Indbinding:
  • Hardback
  • Sideantal:
  • 640
  • Udgivet:
  • 4. september 2009
  • Størrelse:
  • 164x243x34 mm.
  • Vægt:
  • 993 g.
  • 2-3 uger.
  • 24. januar 2025

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Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

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This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

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