Name: Scanning Electron Microscopy
Price: 3250.95 DKK
Availability: InStock
Author: Ludwig Reimer
ISBN: 9783540639763

Scanning Electron Microscopy af Ludwig Reimer

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The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

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Sprog:
Engelsk

ISBN:
9783540639763

Forlag:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Indbinding:
Hardback

Sideantal:
529

Udgivet:
17. september 1998

Udgave:
21998

Størrelse:
242x166x34 mm.

Vægt:
954 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 3. december 2024

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The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

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