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Soft Error Reliability of VLSI Circuits - Behnam Ghavami - Bog

- Analysis and Mitigation Techniques

af Behnam Ghavami
Soft Error Reliability of VLSI Circuits af Behnam Ghavami
Bag om Soft Error Reliability of VLSI Circuits

Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783030516123
  • Indbinding:
  • Paperback
  • Sideantal:
  • 114
  • Udgivet:
  • 14. oktober 2021
  • Udgave:
  • 12021
  • Størrelse:
  • 155x235x0 mm.
  • Vægt:
  • 209 g.
  • 8-11 hverdage.
  • 16. januar 2025

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Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

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Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

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