Bøger i Advances in Imaging and Electron Physics serien

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.Contains contributions from leading authorities on the subject matterInforms and updates all the latest developments in the field of imaging and electron physicsProvides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resourceFeatures extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing

Details the theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. This title attempts to provide assimilation of the presented topics such as: neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.

Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.

Extend the calculus of finite differences to Dirac's equation. The authors obtain solutions for particles with negative mass that are completely equivalent to the solutions with positive mass. They also obtain solutions for nuclear distances of the order of 10-13m and less rather than for the usual atomic distances.