Udvidet returret til d. 31. januar 2025

Bøger af Gavin R. Mallett

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  • - Volume 10
    af Gavin R. Mallett & John B. Newkirk
    848,95 kr.

    The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses sions, Professor R. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.

  • - Volume 12: Proceedings of the Seventeenth Annual Conference on Applications of X-Ray Analysis Held August 21-23, 1968
    af Gavin R. Mallett, Charles S. Barrett & John B. Newkirk
    848,95 kr.

    The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need.

  • - Proceedings of the Sixteenth Annual Conference on Applications of X-Ray Analysis Held August 9-11, 1967 Volume 11
    af Gavin R. Mallett, John B. Newkirk & Heinz G. Pfeiffer
    1.665,95 kr.

    X-ray emission spectrography, while based on Moseley's work, as a generally useful analytical method had its genesis in the work of Friedman, Birks, and Brooks 30 years ago.

  • - Volume 7 Proceedings of the Twelfth Annual Conference on Applications of X-Ray Analysis Held August 7-9, 1963
    af Gavin R. Mallett, Marie Fay & William M. Mueller
    1.221,95 kr.

    knowledge increasing slowly through several centuries, accelerating rapidly during the past twenty years, culminat ing at the present time in a virtual impossibility that one person - one communit- possibly even one nation - can hope to generate or use productively more than a minute portion of the world's scientific knowledge.

  • - Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25-27, 1965
    af Gavin R. Mallett, Marie Fay & William M. Mueller
    605,95 kr.

    The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis.

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