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Bøger af Martin C. Schubert

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  • - Basics and Use for Evaluating Electronic Devices and Materials
    af Otwin Breitenstein, Wilhelm Warta & Martin C. Schubert
    1.718,95 kr.

    This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.

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