Bøger af Valeria Bertacco

The purpose of this book is to survey the state of the art and evolving directions in post-silicon and runtime verification. They then dive into the presentation of several new post-silicon verification solutions aimed at boosting the verification coverage of modern processors, dedicating several chapters to this topic.

This book is intended as an innovative overview of current formal verification methods, combined with an in-depth analysis of some advanced techniques to improve the scalability of these methods, and close the gap between design and verification in computer-aided design.

Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. (2) an RTL error diagnosis method that identifies the root cause of errors directly;

Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. (2) an RTL error diagnosis method that identifies the root cause of errors directly;