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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis - Patrick Echlin - Bog

Bag om Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781441946744
  • Indbinding:
  • Paperback
  • Sideantal:
  • 332
  • Udgivet:
  • 12. oktober 2010
  • Udgave:
  • 12009
  • Størrelse:
  • 254x178x18 mm.
  • Vægt:
  • 655 g.
  • 2-3 uger.
  • 4. december 2024

Normalpris

  • BLACK NOVEMBER

Medlemspris

Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

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