Name: Advanced Scanning Electron Microscopy and X-Ray Microanalysis
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Author: Patrick Echlin
ISBN: 9780306421402

Advanced Scanning Electron Microscopy and X-Ray Microanalysis af Patrick Echlin

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This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.

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Sprog:
Engelsk

ISBN:
9780306421402

Forlag:
Springer Science+Business Media

Indbinding:
Hardback

Sideantal:
454

Udgivet:
1. marts 1986

Udgave:
1986

Størrelse:
234x156x27 mm.

Vægt:
1880 g.

Leveringstid: Ukendt - mangler pt..

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This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.

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