Name: Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Price: 1222.95 DKK
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Author: Patrick Echlin
ISBN: 9781475790290

Advanced Scanning Electron Microscopy and X-Ray Microanalysis af Patrick Echlin

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This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.

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Sprog:
Engelsk

ISBN:
9781475790290

Forlag:
Springer-Verlag New York Inc.

Indbinding:
Paperback

Sideantal:
454

Udgivet:
8. juni 2013

Udgave:
11986

Størrelse:
229x152x24 mm.

Vægt:
692 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 16. januar 2025

Forlænget returret til d. 31. januar 2025

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This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.

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