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  5. Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Bog

indgår i Methods of Surface Characterization serien

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
Bag om Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781441932990
  • Indbinding:
  • Paperback
  • Sideantal:
  • 430
  • Udgivet:
  • 5. december 2010
  • Udgave:
  • 11999
  • Størrelse:
  • 229x152x23 mm.
  • Vægt:
  • 1390 g.
  • 8-11 hverdage.
  • 22. januar 2025

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Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

Brugerbedømmelser af Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis



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