Name: Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Price: 554.95 DKK
Availability: InStock
Author: Mohammed Ismail
ISBN: 9781441995476

Built-in-Self-Test and Digital Self-Calibration for RF SoCs af Mohammed Ismail

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554,95 kr.

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This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).

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Sprog:
Engelsk

ISBN:
9781441995476

Forlag:
Springer-Verlag New York Inc.

Indbinding:
Paperback

Sideantal:
89

Udgivet:
22. september 2011

Udgave:
2012

Størrelse:
234x156x5 mm.

Vægt:
180 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 6. december 2024

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This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).

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