Name: Characterization of Crystal Growth Defects by X-Ray Methods
Price: 721.95 DKK
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Author: B.K. Tanner
ISBN: 9781475711288

Characterization of Crystal Growth Defects by X-Ray Methods af B.K. Tanner

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This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979.

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Sprog:
Engelsk

ISBN:
9781475711288

Forlag:
Springer-Verlag New York Inc.

Indbinding:
Paperback

Sideantal:
589

Udgivet:
16. december 2012

Udgave:
11980

Størrelse:
254x178x31 mm.

Vægt:
1156 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 16. december 2024

Forlænget returret til d. 31. januar 2025

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This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979.

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