Defects in HIgh-k Gate Dielectric Stacks

Du sparer 0% ift. normalprisen Spar 0%

Paperback
8-11 hverdage
2.275,95 kr.

Bag om Defects in HIgh-k Gate Dielectric Stacks

Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-K Dielectric Nano-Electronic Semiconductor Devices, St. Petersburg, Russia, from 11 to 14 July 2005.

Vis mere

Sprog:
Engelsk

ISBN:
9781402043666

Forlag:
Springer-Verlag New York Inc.

Indbinding:
Paperback

Sideantal:
492

Udgivet:
27. januar 2006

Udgave:
2006

Størrelse:
235x155x25 mm.

Vægt:
1560 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 16. januar 2025

Normalpris

2.275,95 kr. + Fragt
~~2.275,95 kr.~~

Medlemspris

2.225,95 kr.

Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af Defects in HIgh-k Gate Dielectric Stacks

Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-K Dielectric Nano-Electronic Semiconductor Devices, St. Petersburg, Russia, from 11 to 14 July 2005.

Brugerbedømmelser af Defects in HIgh-k Gate Dielectric Stacks

Andre købte også..

Find lignende bøger

Bogen Defects in HIgh-k Gate Dielectric Stacks findes i følgende kategorier:

Business og læring

Defects in HIgh-k Gate Dielectric Stacks - Bog

Beskrivelse af Defects in HIgh-k Gate Dielectric Stacks

Brugerbedømmelser af Defects in HIgh-k Gate Dielectric Stacks

Gør som tusindvis af andre bogelskere