Udvidet returret til d. 31. januar 2025

Design, Analysis and Test of Logic Circuits Under Uncertainty - John P. Hayes - Bog

Bag om Design, Analysis and Test of Logic Circuits Under Uncertainty

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9789048196432
  • Indbinding:
  • Hardback
  • Sideantal:
  • 124
  • Udgivet:
  • 21. september 2012
  • Udgave:
  • 2012
  • Størrelse:
  • 234x156x9 mm.
  • Vægt:
  • 3317 g.
  • 8-11 hverdage.
  • 13. december 2024
Forlænget returret til d. 31. januar 2025

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Beskrivelse af Design, Analysis and Test of Logic Circuits Under Uncertainty

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques.

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