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Designer's Guide to Testable Asic Devices - Wayne M. Needham - Bog

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While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact o

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780442002213
  • Indbinding:
  • Hardback
  • Sideantal:
  • 284
  • Udgivet:
  • 10. januar 1991
  • Udgave:
  • 1991
  • Størrelse:
  • 235x155x20 mm.
  • Vægt:
  • 1340 g.
  • 8-11 hverdage.
  • 16. december 2024
Forlænget returret til d. 31. januar 2025

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Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af Designer's Guide to Testable Asic Devices

While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact o

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