Name: Electromigration In Ulsi Interconnections
Price: 1127.95 DKK
Availability: InStock
Author: Cher Ming (Ntu Tan
ISBN: 9789814273329

Electromigration In Ulsi Interconnections af Cher Ming (Ntu Tan

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1.127,95 kr.

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Presents a description of the electro migration in integrated circuits. This book examines the various interconnected systems and their evolution employed in integrated circuit technology. It is suitable for readers on electro migration in ULSI interconnections.

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Sprog:
Engelsk

ISBN:
9789814273329

Forlag:
World Scientific Publishing Co Pte Ltd

Indbinding:
Hardback

Sideantal:
312

Udgivet:
25. August 2010

Størrelse:
229x155x23 mm.

Leveringstid: 2-3 uger.
Forventet levering: 23. Oktober 2024

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Presents a description of the electro migration in integrated circuits. This book examines the various interconnected systems and their evolution employed in integrated circuit technology. It is suitable for readers on electro migration in ULSI interconnections.

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