Evaluation of Advanced Semiconductor Materials by Electron Microscopy

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With these developments in mind, an application was made to the NATO Science Committee in late summer 1987 to fund an Advanced Research Work shop to review the electron microscopy of advanced semiconductors.

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Sprog:
Engelsk

ISBN:
9781461278504

Forlag:
Springer-Verlag New York Inc.

Indbinding:
Paperback

Sideantal:
412

Udgivet:
13. oktober 2011

Udgave:
11989

Størrelse:
244x170x22 mm.

Vægt:
734 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 17. december 2024

Forlænget returret til d. 31. januar 2025

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With these developments in mind, an application was made to the NATO Science Committee in late summer 1987 to fund an Advanced Research Work shop to review the electron microscopy of advanced semiconductors.

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