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This book discusses the implementation of digital circuits by using MCML gates. This book provides a complete automation methodology for the implementation of digital circuits in MCML and provides an extensive explanation on the technical details of design of MCML.
The authors cover the basics of image formation, algorithms for stitching a panoramic image from multiple cameras, and multiple real-time hardware system architectures, in order to have panoramic videos.
In particular, this book will deal with the characterization and patterning of these materials from an engineering perspective, with the objective of creating operational prototypes and products.The book will integrate various nano technologies on materials, devices and systems and identify key areas and results.
In the world of optical data communications this book will be an absolute must-read. It focuses on optical communications for short and very short distance applications and discusses the monolithic integration of optical receivers with processing elements in standard CMOS technologies.
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques.
Based on a new family of logic, this volume presents a completely new approach to implementing ultra-low-power integrated circuits. The text carefully describes how new techniques can be used for digital and analog ultra-low-power design, and includes experimental results.
In the world of optical data communications this book will be an absolute must-read. It focuses on optical communications for short and very short distance applications and discusses the monolithic integration of optical receivers with processing elements in standard CMOS technologies.
The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits.
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