Name: Hot-Carrier Reliability of MOS VLSI Circuits
Price: 2221.95 DKK
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Author: Yusuf Leblebici
ISBN: 9780792393528

Hot-Carrier Reliability of MOS VLSI Circuits af Yusuf Leblebici

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The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits.

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Sprog:
Engelsk

ISBN:
9780792393528

Forlag:
Springer

Indbinding:
Hardback

Sideantal:
212

Udgivet:
2. juni 1993

Udgave:
1993

Størrelse:
234x156x14 mm.

Vægt:
1130 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 6. december 2024

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The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits.

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