Name: From Contamination to Defects, Faults and Yield Loss
Price: 1052.95 DKK
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Author: Jitendra B. Khare
ISBN: 9781461285953

From Contamination to Defects, Faults and Yield Loss af Jitendra B. Khare

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Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

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Sprog:
Engelsk

ISBN:
9781461285953

Forlag:
Springer-Verlag New York Inc.

Indbinding:
Paperback

Sideantal:
150

Udgivet:
26. September 2011

Udgave:
11996

Størrelse:
234x156x9 mm.

Vægt:
272 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 2. Oktober 2024

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Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

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