From scientific instrument to industrial machine

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Paperback
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556,95 kr.

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Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In this book, the authors look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company.

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Sprog:
Engelsk

ISBN:
9789400741461

Forlag:
Springer

Indbinding:
Paperback

Sideantal:
112

Udgivet:
27. april 2012

Udgave:
2012

Størrelse:
234x156x6 mm.

Vægt:
203 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 6. december 2024

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Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In this book, the authors look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company.

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