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Bag om Helium Ion Microscopy

This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.

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Sprog:
Engelsk

ISBN:
9783319824734

Forlag:
Springer International Publishing AG

Indbinding:
Paperback

Sideantal:
526

Udgivet:
16. Juni 2018

Udgave:
12016

Størrelse:
155x235x0 mm.

Vægt:
836 g.

Leveringstid: 2-4 uger.
Forventet levering: 25. Juni 2024

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This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.

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