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Identification of Defects in Semiconductors - Bog

Bag om Identification of Defects in Semiconductors

Since its inception in 1966, the series of numbered volumes known as "Semiconductors and Semimetals" has distinguished itself through the selection of authors, editors, and contributors. Reflecting the interdisciplinary nature of the field that the series covers, these volumes are aimed at physicists, chemists, materials scientists, and others.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780127521596
  • Indbinding:
  • Hardback
  • Sideantal:
  • 376
  • Udgivet:
  • 2. juli 1998
  • Størrelse:
  • 152x229x25 mm.
  • Vægt:
  • 800 g.
  • 2-3 uger.
  • 6. december 2024

Normalpris

  • BLACK NOVEMBER

Medlemspris

Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af Identification of Defects in Semiconductors

Since its inception in 1966, the series of numbered volumes known as "Semiconductors and Semimetals" has distinguished itself through the selection of authors, editors, and contributors. Reflecting the interdisciplinary nature of the field that the series covers, these volumes are aimed at physicists, chemists, materials scientists, and others.

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