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Microscopy of Semiconducting Materials - Bog

- 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK

indgår i Institute of Physics Conference Series serien

Microscopy of Semiconducting Materials
Bag om Microscopy of Semiconducting Materials

Presents an overview of advances in semiconductor studies using microscopy. This book explores the use of transmission and scanning electron microscopy, ultra fine electron probes, and EELS to investigate semi conducting structures. It is suitable for academics and researchers in materials science, and electrical and electronic engineering.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780750306508
  • Indbinding:
  • Hardback
  • Sideantal:
  • 772
  • Udgivet:
  • 1. januar 2000
  • Størrelse:
  • 156x234x41 mm.
  • Vægt:
  • 1428 g.
  • 8-11 hverdage.
  • 21. januar 2025
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Prøv i 30 dage for 45 kr.
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Beskrivelse af Microscopy of Semiconducting Materials

Presents an overview of advances in semiconductor studies using microscopy. This book explores the use of transmission and scanning electron microscopy, ultra fine electron probes, and EELS to investigate semi conducting structures. It is suitable for academics and researchers in materials science, and electrical and electronic engineering.

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