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Microscopy of Semiconducting Materials 2007 - Bog

- Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK

indgår i Springer Proceedings in Physics serien

Microscopy of Semiconducting Materials 2007
Bag om Microscopy of Semiconducting Materials 2007

In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781402086144
  • Indbinding:
  • Hardback
  • Sideantal:
  • 498
  • Udgivet:
  • 18. september 2008
  • Udgave:
  • 2008
  • Størrelse:
  • 235x155x25 mm.
  • 8-11 hverdage.
  • 5. december 2024
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Beskrivelse af Microscopy of Semiconducting Materials 2007

In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes.

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