Vi bøger
Levering: 1 - 2 hverdage

Point and Extended Defects in Semiconductors - Bog

Bag om Point and Extended Defects in Semiconductors

The systematic study of defects in semiconductors began in the early fifties. Most participants are currently working on defect problems in either silicon submicron technology or in quantum wells and superlattices, where point defects, dislocations, interfaces and surfaces are closely packed together.

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9781468457117
  • Indbinding:
  • Paperback
  • Sideantal:
  • 287
  • Udgivet:
  • 16. april 2013
  • Udgave:
  • 11989
  • Størrelse:
  • 254x178x15 mm.
  • Vægt:
  • 574 g.
  • 8-11 hverdage.
  • 18. december 2024
Forlænget returret til d. 31. januar 2025

Normalpris

Medlemspris

Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af Point and Extended Defects in Semiconductors

The systematic study of defects in semiconductors began in the early fifties. Most participants are currently working on defect problems in either silicon submicron technology or in quantum wells and superlattices, where point defects, dislocations, interfaces and surfaces are closely packed together.

Brugerbedømmelser af Point and Extended Defects in Semiconductors



Find lignende bøger
Bogen Point and Extended Defects in Semiconductors findes i følgende kategorier:

Gør som tusindvis af andre bogelskere

Tilmeld dig nyhedsbrevet og få gode tilbud og inspiration til din næste læsning.