Name: Radiation-induced Soft Error
Price: 854.95 DKK
Availability: InStock
Author: Norbert Seifert
ISBN: 9781601983947

Radiation-induced Soft Error af Norbert Seifert

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854,95 kr.

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A simulation-based methodology of chip-level radiation-induced soft error rates that is fast and reasonably accurate is crucial to the reliability and success of a final product. This book summarises selected publications that are deemed relevant by the author to enable a truly chip-level radiation-induced soft error rate estimation methodology.

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Sprog:
Engelsk

ISBN:
9781601983947

Forlag:
now publishers Inc

Indbinding:
Paperback

Sideantal:
136

Udgivet:
27. november 2010

Størrelse:
157x234x8 mm.

Vægt:
210 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 9. december 2024

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A simulation-based methodology of chip-level radiation-induced soft error rates that is fast and reasonably accurate is crucial to the reliability and success of a final product. This book summarises selected publications that are deemed relevant by the author to enable a truly chip-level radiation-induced soft error rate estimation methodology.

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