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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - Bog
- Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002
indgår i NATO Science Series II serien
- Indbinding:
- Paperback
- Sideantal:
- 488
- Udgivet:
- 21. Februar 2005
- Udgave:
- 2005
- Størrelse:
- 235x155x27 mm.
- Vægt:
- 791 g.
- 2-3 uger.
- 19. Juli 2024
Normalpris
Medlemspris
Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.
Herefter fra 79 kr./md. Ingen binding.
Beskrivelse af Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.
Brugerbedømmelser af Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
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