Site Characterization and Aggregation of Implanted Atoms in Materials

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An Advanced Study Institute, covering the basic and common phenomena of aggregation, seems opportune for initiating interested scientists and engineers into these various active subfields since aggregation usually follows ion implantation.

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Sprog:
Engelsk

ISBN:
9780306402999

Forlag:
Springer Science+Business Media

Indbinding:
Hardback

Sideantal:
520

Udgivet:
1. januar 1980

Udgave:
1980

Vægt:
1041 g.

Leveringstid: Ukendt - mangler pt..

Forlænget returret til d. 31. januar 2025

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Beskrivelse af Site Characterization and Aggregation of Implanted Atoms in Materials

An Advanced Study Institute, covering the basic and common phenomena of aggregation, seems opportune for initiating interested scientists and engineers into these various active subfields since aggregation usually follows ion implantation.

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