Name: Advanced Test Methods for SRAMs
Price: 1188.95 DKK
Availability: InStock
Author: Alberto Bosio
ISBN: 9781489983145

Advanced Test Methods for SRAMs af Alberto Bosio

Du sparer 0% ift. normalprisen Spar 0%

Bag om Advanced Test Methods for SRAMs

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies.

Vis mere

Sprog:
Engelsk

ISBN:
9781489983145

Forlag:
Springer-Verlag New York Inc.

Indbinding:
Paperback

Sideantal:
171

Udgivet:
3. september 2014

Udgave:
2010

Størrelse:
235x155x10 mm.

Vægt:
297 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 9. december 2024

Normalpris

BLACK WEEK
1.188,95 kr. + Fragt
~~1.188,95 kr.~~

Medlemspris

1.138,95 kr.

Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Bag om Alberto Bosio

Vis alle bøger af Alberto Bosio

Beskrivelse af Advanced Test Methods for SRAMs

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies.

Brugerbedømmelser af Advanced Test Methods for SRAMs

Andre købte også..

Find lignende bøger

Bogen Advanced Test Methods for SRAMs findes i følgende kategorier:

Business og læring > Computer og IT

Advanced Test Methods for SRAMs - Alberto Bosio - Bog

Bag om Alberto Bosio

Beskrivelse af Advanced Test Methods for SRAMs

Brugerbedømmelser af Advanced Test Methods for SRAMs

Gør som tusindvis af andre bogelskere