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Hardback
8-11 hverdage
1.643,95 kr.

Bag om Applied Scanning Probe Methods I

This book surveys near-field scanning probe techniques, covering static and dynamic force microscopies, including sensor technology and tip characterization. Details applications such as macro- and nanotribology, polymer surfaces and roughness investigations.

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Sprog:
Engelsk

ISBN:
9783540005278

Forlag:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Indbinding:
Hardback

Sideantal:
476

Udgivet:
13. januar 2004

Udgave:
2004

Størrelse:
235x155x27 mm.

Vægt:
1002 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 19. november 2024

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Beskrivelse af Applied Scanning Probe Methods I

This book surveys near-field scanning probe techniques, covering static and dynamic force microscopies, including sensor technology and tip characterization. Details applications such as macro- and nanotribology, polymer surfaces and roughness investigations.

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