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Hardback
8-11 hverdage
1.028,95 kr.

Bag om Applied Scanning Probe Methods IV

Provides a comprehensive overview of SPM applications. The international perspective offered in these three volumes contributes to the evolution of SPM techniques. Volumes II, III and IV examine the physical and technical foundation for progress in applied near-field scanning probe techniques.

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Sprog:
Engelsk

ISBN:
9783540269120

Forlag:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Indbinding:
Hardback

Sideantal:
284

Udgivet:
22. februar 2006

Udgave:
2006

Størrelse:
235x155x17 mm.

Leveringstid: 8-11 hverdage.
Forventet levering: 19. november 2024

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Provides a comprehensive overview of SPM applications. The international perspective offered in these three volumes contributes to the evolution of SPM techniques. Volumes II, III and IV examine the physical and technical foundation for progress in applied near-field scanning probe techniques.

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