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  5. Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces - Weronika Walkosz - Bog

af Weronika Walkosz

indgår i Springer Theses serien

Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces af Weronika Walkosz
Bag om Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781441978165
  • Indbinding:
  • Hardback
  • Sideantal:
  • 110
  • Udgivet:
  • 8. april 2011
  • Størrelse:
  • 241x162x12 mm.
  • Vægt:
  • 324 g.
  • 8-11 hverdage.
  • 6. marts 2025

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Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

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Beskrivelse af Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.

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