Vi bøger
Trustpilot
Levering: 1 - 2 hverdage
Hjælp
Login
  1. Forside
  2. Bøger
  3. Business og læring
  4. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - Andrei Pavlov - Bog

- Process-Aware SRAM Design and Test

af Andrei Pavlov, Manoj Sachdev

indgår i Frontiers in Electronic Testing serien

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies af Andrei Pavlov
Bag om CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9781402083624
  • Indbinding:
  • Hardback
  • Sideantal:
  • 194
  • Udgivet:
  • 1. Maj 2008
  • Udgave:
  • 2008
  • Størrelse:
  • 239x166x19 mm.
  • Vægt:
  • 468 g.
  • 2-3 uger.
  • 4. Oktober 2024
På lager

Normalpris

Medlemspris

Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Bag om Andrei Pavlov

Vis alle bøger af Andrei Pavlov

Beskrivelse af CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

Brugerbedømmelser af CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies



Andre købte også..
Find lignende bøger
Bogen CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies findes i følgende kategorier:

Gør som tusindvis af andre bogelskere

Tilmeld dig nyhedsbrevet og få gode tilbud og inspiration til din næste læsning.