Name: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Price: 2187.95 DKK
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Author: Manoj Sachdev
ISBN: 9781441942852

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits af Manoj Sachdev

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The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

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Sprog:
Engelsk

ISBN:
9781441942852

Forlag:
Springer-Verlag New York Inc.

Indbinding:
Paperback

Sideantal:
328

Udgivet:
12. februar 2010

Udgave:
22007

Størrelse:
234x156x18 mm.

Vægt:
539 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 13. december 2024

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Forlænget returret til d. 31. januar 2025

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The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

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