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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Manoj Sachdev - Bog

af Manoj Sachdev, José Pineda de Gyvez

indgår i Frontiers in Electronic Testing serien

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits af Manoj Sachdev
Bag om Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781441942852
  • Indbinding:
  • Paperback
  • Sideantal:
  • 328
  • Udgivet:
  • 12. Februar 2010
  • Udgave:
  • 22007
  • Størrelse:
  • 234x156x18 mm.
  • Vægt:
  • 539 g.
  • 2-3 uger.
  • 1. Oktober 2024
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Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

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The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

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