Defects and Properties of Semiconductors

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Defect study in semiconductor engineering started originally with seeking methods how to suppress generation of harmful defects during device processing in order to achieve a high yield of device fabrication.

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Sprog:
Engelsk

ISBN:
9789027723529

Forlag:
Springer

Indbinding:
Hardback

Sideantal:
300

Udgivet:
31. Marts 1987

Udgave:
1986

Vægt:
570 g.

Leveringstid: Ukendt - mangler pt..

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952,95 kr.

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Beskrivelse af Defects and Properties of Semiconductors

Defect study in semiconductor engineering started originally with seeking methods how to suppress generation of harmful defects during device processing in order to achieve a high yield of device fabrication.

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