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Diffraction from Materials - Jerome B. Cohen - Bog

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With new tools such as the high-resolution electron microscope, new detectors, new techniques (such as EXAFS and glancing angle diffraction) and the new sources, the horizons of this field greatly expanded in the 1950's and 60's.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783642829291
  • Indbinding:
  • Paperback
  • Sideantal:
  • 591
  • Udgivet:
  • 21. februar 2013
  • Udgave:
  • 21987
  • Størrelse:
  • 244x170x31 mm.
  • Vægt:
  • 1040 g.
  • 8-11 hverdage.
  • 29. november 2024

Normalpris

  • BLACK NOVEMBER

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Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af Diffraction from Materials

With new tools such as the high-resolution electron microscope, new detectors, new techniques (such as EXAFS and glancing angle diffraction) and the new sources, the horizons of this field greatly expanded in the 1950's and 60's.

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