Electrical Atomic Force Microscopy for Nanoelectronics

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Hardback
8-11 hverdage
2.008,95 kr.

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The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development.

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Sprog:
Engelsk

ISBN:
9783030156114

Forlag:
Springer Nature Switzerland AG

Indbinding:
Hardback

Sideantal:
408

Udgivet:
24. august 2019

Udgave:
12019

Vægt:
805 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 13. december 2024

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Forlænget returret til d. 31. januar 2025

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Beskrivelse af Electrical Atomic Force Microscopy for Nanoelectronics

The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development.

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