Name: Field-Ion Microscopy
Price: 1265.95 DKK
Availability: InStock
Author: R. Wagner
ISBN: 9783642686894

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Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the surface of a metal.

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Sprog:
Engelsk

ISBN:
9783642686894

Forlag:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Indbinding:
Paperback

Sideantal:
118

Udgivet:
7. december 2011

Udgave:
11982

Størrelse:
244x170x7 mm.

Vægt:
242 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 28. november 2024

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Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the surface of a metal.

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