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Helps to improve fundamentals and applications of various modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. This title intends to promote the measurement of samples while reducing the scattered background in the x-ray spectrum.

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Sprog:
Engelsk

ISBN:
9780824706005

Forlag:
Taylor & Francis Inc

Indbinding:
Hardback

Sideantal:
1004

Udgivet:
27. november 2001

Udgave:
2

Størrelse:
184x262x58 mm.

Vægt:
1960 g.

Leveringstid: 2-4 uger.
Forventet levering: 28. januar 2025

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Helps to improve fundamentals and applications of various modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. This title intends to promote the measurement of samples while reducing the scattered background in the x-ray spectrum.

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