Name: High-Resolution X-Ray Scattering
Price: 1446.95 DKK
Availability: InStock
Author: Ullrich Pietsch
ISBN: 9780387400921

High-Resolution X-Ray Scattering af Ullrich Pietsch

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During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.

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Sprog:
Engelsk

ISBN:
9780387400921

Forlag:
Springer-Verlag New York Inc.

Indbinding:
Hardback

Sideantal:
408

Udgivet:
27. august 2004

Udgave:
22004

Størrelse:
234x156x23 mm.

Vægt:
860 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 15. januar 2025

Forlænget returret til d. 31. januar 2025

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During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.

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